TEC|MAP: new methods to integrate imperfections in simulation models

Most finite element (FE) simulation models represent the ideal state of a structure. However, in real life, deviations during manufacture or operation can cause imperfections which have an impact on a structure’s behaviour. It is important to include and evaluate the effects of these imperfections during simulation. TECOSIM developed a process that allows automatic updating of finite element simulation models based on image data as part of the Add2Reliablade research project funded by the German Federal Ministry for Economic Affairs and Climate Action.

The method comprises three main modules:
– an application for visualising image data and defining imperfections in the real structure.
– a method for creating machine learning (ML) algorithms to identify imperfections.
– a module for automatically integrating different imperfections in FE simulation models.

The application GUI

Procedure
In this method, the engineers use image data, especially those from the computer tomography (CT), to annotate imperfections. These annotations are stored in the framework, with ML models available to assist users as needed. During the research project, the experts also developed a process to create and train new ML models.
After annotation, the imperfections are superimposed on the simulation results to evaluate their impact. The user can then decide how the imperfections should be included in the simulation model.

Further information
An FEM database which provides routines for importing, editing and exporting simulation models has been created to implement imperfections in simulation models. This database structure provides flexible adjustment to imperfections and is compatible with different solvers.

Summary
The TECOSIM method allows real-life imperfections to be incorporated into simulation models, thus providing a more realistic analysis of structural behaviour. It offers an efficient, precise approach to including complex imperfections in the simulation world. It can be used in combination or developed separately.

The developed application’s data and schematic diagram of modules

Flyer: TEC|MAP – Integrating imperfections into simulation models

Back to the Media Hub

Author picture

Are you a journalist and still have questions?

Speak to Bettina Schmidt

Director of Corporate Communications